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Atomic Force Microscope For Performing Surface Topology Analysis Of Target And Optical Materials
| Buyer : Fyzikální ústav AV ČR, v. v. i. | |
| Create/Change Date : 2024-05-16 21:21:37 | Countries : [Czech Republic] |
| Deadline : 2024-06-17 00:00:00 | Type : Invitation for Bids |
| Original Language : cs | |
| Estimated Value : 0 | View Details |
Atom Probe Tomography_Cig A01Bf5Bc2E
| Buyer : Institute for Microelectronics and Microsystems - National Research Council | |
| Create/Change Date : 2023-10-17 13:20:28 | Countries : [Italy] |
| Deadline : 2024-10-16 00:00:00 | Type : Procurement Plan |
| Original Language : Italian | |
| Estimated Value : EUR | View Details |
Exploratory Market Survey For The Acquisition Of N.1 Scanning Optical Microscope In Near Field Of Diffusion Type (S-Snom)
| Buyer : National Institute of Optics (INO) of the National Research Council | |
| Create/Change Date : 2023-06-30 15:20:28 | Countries : [Italy] |
| Deadline : 2024-06-29 00:00:00 | Type : Procurement Plan |
| Original Language : Italian | |
| Estimated Value : EUR | View Details |
Exploratory Market Survey For The Acquisition Of 1 Near Field Scanning Optical Microscope Of Diffusion Type (S-Snom)
| Buyer : National Institute of Optics (INO) of the National Research Council | |
| Create/Change Date : 2023-06-30 20:22:17 | Countries : [Italy] |
| Deadline : 2024-06-29 00:00:00 | Type : Procurement Plan |
| Original Language : Italian | |
| Estimated Value : EUR | View Details |
Scanning probe microscopes
| Buyer : Universität Potsdam | |
| Create/Change Date : 2022-02-21 21:14:52 | Countries : [Germany] |
| Deadline : | Type : Invitation for Bids |
| Original Language : German | |
| Estimated Value : 0 | View Details |